Advanced Production Testing of RF, SoC, and SiP Devices by Joe Kelly

By Joe Kelly

That includes precious enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its variety source deals skilled engineers a accomplished figuring out of the complex subject matters in RF, SiP (system-in-package), and SoC (system-on-a-chip) creation trying out which are serious to their paintings concerning semiconductor units. The booklet covers key size thoughts for semiconductor machine trying out and assists engineers in explaining those options to administration to help reduce venture expense, time, and assets. in accordance with real-world adventure and filled with time-saving equations, this in-depth quantity bargains execs useful info on crucial themes that experience by no means been provided in one reference sooner than.

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Additional resources for Advanced Production Testing of RF, SoC, and SiP Devices

Example text

To guarantee that all divider settings work, in most cases test modes have been built into the device that allow the test engineer to verify the functionality of the dividers with just a few tests. A test mode is a device state in which the test engineer can access functions that are not intended for use in the final application. The purpose of a test mode is to allow measurements that are otherwise not possible to perform, for instance, by routing an internal signal to a pin that is used for other functions during normal operation.

Even though the design engineer tries to minimize the spurs that are created by the phase detector, they can never be completely avoided. Other spurs that are commonly seen are the spectral components from the reference frequency or a fraction of the reference frequency. Every wireless standard has some form of requirement in terms of what bandwidth it is allowed to occupy and how much energy it is allowed to leak into other channels, or the maximum allowed power per spur. 3 shows an example where the modulated spectrum can be seen on the left side.

To determine the pulsed power, additional parameters such as duty cycle or measurement filter type have to be specified. More specific information about measuring modulated or pulsed power can be found in [3]. 2 Spur Measurements As mentioned in Chapter 1, most tests in RF SoC devices are still performed with CW signals despite the test system’s ability to apply and measure modulated or pulsed power. A typical measurement that falls into this category is a spur measurement. A spur is an RF tone that is in the frequency band of interest even though it is not intended to be there.

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